Por favor utiliza este link para citar o compartir este documento: http://repositoriodigital.academica.mx/jspui/handle/987654321/85964
Título: Non-destructive measurement of the dielectric constant of solid samples
Palabras clave: Capacitance measurements
dielectric constant
pointer electrode
materials characterization
Fecha de publicación: 31-Jul-2012
Editorial: Revista mexicana de física
Descripción: We discuss and analyze a practical methodology for the determination of the dielectric constant of a macroscopic solid sample in a nondestructive way. The technique consists in measuring the capacitance between a pointer electrode and the dielectric surface as a function of the separation distance in a scale comparable to the radius of curvature of the tip's apex. The changes in capacitance that must be measured will commonly be in the atto-farad scale and require specialized instrumentation which we also describe here. The technique requires two calibration standards and the sample needs to have a portion of its surface flat and some minimum dimensions, but otherwise it can have an arbitrary shape. We used a simple model based on the method of images to explain the methodology and present experimental results with the proposed methodology.
Other Identifiers: http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2009000600012
Aparece en las Colecciones:Revista Mexicana de Física

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