Por favor utiliza este link para citar o compartir este documento: http://repositoriodigital.academica.mx/jspui/handle/987654321/85714
Título: X-ray production induced by heavy ion impact: challenges and possible uses
Palabras clave: X-rays
ionization
heavy ion impact
PIXE
Fecha de publicación: 31-Jul-2012
Editorial: Revista mexicana de física
Descripción: The emission of X-rays after the excitation with photons, electrons, or light ions (such as protons or deuterons), has been extensively studied. However, when heavier ions are used as primary radiation to induce this effect, other phenomena appear that are not present in the other cases. They include, for example, the formation of short-lived molecules, the capture of electrons from the target atom by the incoming ion, and a strong increase in the multiple ionization of the target atom. Usually, the ionization cross sections are higher as compared to those of photons, electrons, or protons. Furthermore, when thick targets are irradiated with heavy ions, there is a larger probability to create defects in the material, and also a higher stopping power in the target material. All these differences make the study of the X-ray production by heavy ions a problem not fully understood, and far from being applied in an extensive manner to the characterization of materials. In this work, an explanation of the basic phenomena is presented, together with possible uses of the emission of X-rays by the impact of the heavy ions, as an extension of the traditional method Particle Induced X-ray Emission (PIXE).
Other Identifiers: http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2007000900008
Aparece en las Colecciones:Revista Mexicana de Física

Archivos de este documento:
No hay archivos asociados a este documento.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.